Publication | Open Access
Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique
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Citations
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References
2012
Year
EngineeringMicroscopyExperimental SetupSemiconductor DeviceTunneling MicroscopyMicroscopy MethodQplus SensorNanometrologyInstrumentationElectrical EngineeringPhysicsDissipation MeasurementsSurface CharacterizationNatural SciencesSpectroscopySurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopySurface AnalysisQplus Setup
We present the results of simultaneous scanning-tunneling and frequency-modulated dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a purely electrical sensor based on a quartz tuning fork. If both the tunneling current and the force signal are to be measured at the tip, a cross-talk of the tunneling current with the force signal can easily occur. The origin and general features of the capacitive cross-talk will be discussed in detail in this contribution. Furthermore, we describe an experimental setup that improves the level of decoupling between the tunneling-current and the deflection signal. The efficiency of this experimental setup is demonstrated through topography and site-specific force/tunneling-spectroscopy measurements on the Si(111) 7×7 surface. The results show an excellent agreement with previously reported data measured by optical interferometric deflection.
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