Journal of Applied Physics · 2014 · 90 citations · 29 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor MaterialsThin FilmsNanoelectronicsNanostructured Electronic MaterialsQuantum DotsSemiconductor NanomaterialsSemiconductor PhysicsSemiconductor Thin Films1/F NoiseHopping DynamicsMobility FluctuationsNanocrystalsNoise Sources In Semiconductor MaterialsSemiconductor NoiseSemiconductor Quantum DotsTemperature Dependence
Electrical 1/f noise is measured in thin films of CdSe, CdSe/CdS, ZnO, HgTe quantum dots and Au nanocrystals. The 1/f noise, normalized per nanoparticle, shows no systematic dependence on the nanoparticle material and the coupling material. However, over 10 orders of magnitude, it correlates well with the nearest neighbor conductance suggesting some universal magnitude of the 1/f noise in these granular conductors. In the hopping regime, the main mechanism of 1/f noise is determined to be mobility fluctuated. In the metallic regime obtained with gold nanoparticle films, the noise drops to a similar level as bulk gold films and with a similar temperature dependence.
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