Journal of Physics D Applied Physics · 1979 · 39 citations · 4 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationOpticsThin FilmsOptical MetrologyOptical Properties Of MaterialsOptical Thin FilmsPhysical OpticsSurface RoughnessThin Film Optical PropertiesFilm ThicknessOptical ConstantsOptical ReflectanceOptical Thin Film CharacterizationOptical TransmittanceThickness-dependent Optical PropertiesThin Film Surface RoughnessThin-film Optical Characterization
A method is presented for determining the optical constants of films which have a slightly rough upper surface and which are somewhat optically inhomogeneous along the normal to the film surface. It is shown how the RMS height of surface irregularities, the value of introduced parameter a describing the optical and inhomogeneity and film thickness can be calculated on the basis of measured transmittance and reflectance in the region of interference fringes.
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The effects of sample imperfections on optical spectra
I. Filiński · physica status solidi (b) · 1972 · 120 citations