Phase transition characteristics and electrical properties of nitrogen-doped GeSb thin films for PRAM applications - Concepedia

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Phase transition characteristics and electrical properties of nitrogen-doped GeSb thin films for PRAM applications

18

Citations

13

References

2009

Year

Seung Yun Lee, Hyung Keun Kim, Jin Hyock Kim, Jae Sung Roh, Doo Jin Choi

Journal of Materials Science

Materials ScienceElectrical EngineeringPhase Transition CharacteristicsEngineeringOxide ElectronicsApplied PhysicsPram ApplicationsSemiconductor MaterialThin FilmsEpitaxial GrowthElectrical PropertiesThin Film Processing

References

	Year	Citations

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