X-ray sensitivity of a charge-coupled-device array

Abstract

The quantitative response of a charge-coupled device (CCD) to x rays in the 5–14-keV range was measured and computed. Comparison of experimental and theoretical quantum efficiencies provides a method to determine electron diffusion lengths in these devices. Compared to a common x-ray film, the CCD amplifier combination tested in this work has a similar threshold and significantly smaller range of response. The CCD offers somewhat poorer spatial resolution than the x-ray film. Comparisons of the CCD with other active x-ray detectors are also presented.