Concepedia

Characterisation of the BaTiO3/p-Si interface and applications

E. K. Evangelou, N. Konofaos, M.R. Craven, W. M. Cranton, C.B. Thomas

Applied Surface Science · 2000 · 25 citations · 15 references

DOI

Concepts

References

15

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

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A single-frequency approximation for interface-state density determination

Winfield Hill, C. C. Coleman · Solid-State Electronics · 1980 · 724 citations

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Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements

R. Castagné, A. Vapaille · Surface Science · 1971 · 521 citations

Structural and electrical properties of rf-sputtered amorphous barium titanate thin films

K. Sreenivas, Abhai Mansingh, M. Sayer · Journal of Applied Physics · 1987 · 142 citations

, , +14

Growth and dielectric characterization of yttrium oxide thin films deposited on Si by r.f.-magnetron sputtering

W. M. Cranton, David Spink, Robert S. Stevens et al. · Thin Solid Films · 1993 · 65 citations

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