A single-frequency approximation for interface-state density determination

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.3K citations

Semiconductors, Electrical Engineering, Engineering +14

The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique

E. H. Nicollian, A. Goetzberger · Bell System Technical Journal · 1967 · 1.8K citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

Lewis M. Terman · Solid-State Electronics · 1962 · 1.4K citations

Electrical Engineering, Semiconductor Device, Engineering +7

Surface states at steam-grown silicon-silicon dioxide interfaces

C. N. Berglund · IEEE Transactions on Electron Devices · 1966 · 668 citations

Electrical Engineering, Semiconductor Device, Engineering +12

DENSITY OF SiO2–Si INTERFACE STATES

Peter V. Gray, D.M. Brown · Applied Physics Letters · 1966 · 405 citations · Full text

Semiconductor Material, Applied Physics