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Effect of TSV density on local stress concentration: Micro-Raman spectroscopy measurement and Finite Element Analysis

DOI

13

Citations

5

References

2013

Year

F. Le Texier, J. Mazuir, Meiying Su, Laetitia Castagné, Jean-Charles Souriau, Jean-Luc Liotard, Mohamed Saadaoui, K. Inal
Microelectronic Engineering

References

YearCitations

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