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Selective reflection by Rb
37
Citations
18
References
1997
Year
Short Wavelength OpticEngineeringRayleigh ScatteringSpectroscopic PropertyPerpendicular ReflectionRadiative TransferReflection RemovalOptical PropertiesComputational ImagingPhysicsAtomic PhysicsRadiation TransportInverse Scattering TransformsInverse ProblemsNatural SciencesSpectroscopyWave ScatteringApplied PhysicsRb DensitiesSelective Reflection
Perpendicular reflection of low-power, near-resonant radiation at a sapphire--Rb-vapor interface (selective reflection) has been measured for Rb densities of $3\ifmmode\times\else\texttimes\fi{}{10}^{14}--3\ifmmode\times\else\texttimes\fi{}{10}^{17}/{\mathrm{cm}}^{3}$. At the lowest density the eight hyperfine components are essentially isolated, and at the highest pressure they are highly blended. The data have been fitted to a coherent superposition of the reflected field amplitudes of the eight components, including the well-known starting transient and wall interaction. At low to moderate densities this yields a good fit to the data, and a result for the Rb-Rb collisional shift. At the higher densities the rapid attenuation of the incident field has a major effect on the reflection spectrum, and an approximation to this is included in the calculation, assuming exponential attenuation at the equilibrium-vapor rate. This provides improved fits to the data and allows the apparent Lorentz-Lorenz plus collisional shift to be evaluated. However, the data do not fully fit this calculation, and a complete self-consistent-field calculation appears necessary to fully understand the high-pressure results.
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