Concepedia

Publication | Closed Access

Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers

DOI

12

Citations

11

References

1996

Year

F.‐G. Kirscht, Y. Furukawa, W. Seifert, K. Schmalz, A. Buczkowski, S.B. Kim, Hidenobu Abe, Hiroshi Koya, Jeff Bailey
Materials Science and Engineering B

References

YearCitations

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