Microstructural changes of Pt/Ti bilayer during annealing in different atmospheres — an XRD study

Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt · Physical Review · 1954 · 5.1K citations

Natural Sciences, Chemistry, Materials Science +15

The Effect of Cold-Work Distortion on X-Ray Patterns

Β. E. Warren, B. L. Averbach · Journal of Applied Physics · 1950 · 1.4K citations

Natural Sciences, Materials Engineering, Materials Science +16

Anomalous Surface Reflection of X Rays

Yasuharu Yoneda · Physical Review · 1963 · 665 citations

Natural Sciences, Materials Science, Crystal Structure +12

Ferroelectric materials for 64 Mb and 256 Mb DRAMs

Logan Parker, A.F. Tasch · IEEE Circuits and Devices Magazine · 1990 · 304 citations

Natural Sciences, Materials Engineering, Materials Science +17

Investigation of Pt/Ti bilayer metallization on silicon for ferroelectric thin film integration

K. Sreenivas, Ian M. Reaney, Thomas Maeder et al. · Journal of Applied Physics · 1994 · 282 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17