IEEE Microwave Magazine · 2000 · 11 citations · 4 references
EngineeringComputational EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesCurve ModelingDevice CharacterizationDevice ModelingDevice SimulationPhysical DesignSpline CurvesB-spline ModelingB-spline SurfacesCompact Model Parameter ExtractionPhysics-based Device ModelingSpline Approximation TheorySpline Basis FunctionsSpline ModelingSpline Surface Fitting
The proposed method is based on spline functions, takes into account thermal and noise effects, allows a scaling of different FET device geometries, and is available in commercial CAD software like Agilents Series IV or ADS.
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