Publication | Closed Access
Scanning maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin films
112
Citations
12
References
1994
Year
Materials ScienceEngineeringMicroscopyNanotechnologyMicrofabricationSurface ScienceApplied PhysicsMicroscopy MethodScanning Probe MicroscopyMaxwell Stress MicroscopeScanning Force MicroscopyNanometrologyThin Films
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