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Anisotropic etching of GaAs using a hot Cl2 molecular beam
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1991
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SemiconductorsMaterials ScienceOptical MaterialsEngineeringElectron-beam LithographyPhysicsSmooth Bottom SurfaceNanoelectronicsBeam LithographyApplied PhysicsAspect RatioSemiconductor Device FabricationMolecular Beam EpitaxyMicroelectronicsPlasma EtchingOptoelectronicsCompound SemiconductorAnisotropic Etching
Anisotropic etching of GaAs(100) is performed using a hot Cl2 molecular beam produced by free expansion of gas heated in a furnace. The etch rate is 1.5 μm/min at a furnace temperature of 800 °C and a substrate temperature of 120 °C. An aspect ratio of ten and an almost smooth bottom surface are obtained under this condition.