Copper interconnection integration and reliability - Concepedia

Concepedia

Publication | Closed Access

Copper interconnection integration and reliability

222

Citations

12

References

1995

Year

C.‐K. Hu, B. M. Luther, F. B. Kaufman, J.P. Hummel, Cyprian Uzoh, D.J. Pearson

Thin Solid Films

ReliabilityCopper Interconnection IntegrationElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityElectromigration TechniqueComputer EngineeringElectronic PackagingMicroelectronicsInterconnect (Integrated Circuits)

References

	Year	Citations

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