Concepedia

X-ray topography with highly collimated beam at photon factory

Tetsuya Ishikawa

Review of Scientific Instruments · 1989 · 21 citations · 6 references

DOI

Concepts

Abstract

Recent developments of a high-precision diffractometer for multiple crystal arrangement at the Photon Factory is described. New x-ray optics for topography using this diffractometer are shown, including plane-wave topography, ultraplane wave topography and equilattice-spacing mapping topography.

References

6

X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. I. General Considerations on Collimators

Seishi Kikuta, Kazutake Köhra · Journal of the Physical Society of Japan · 1970 · 98 citations

, , +14

Measurement of the coherence length of highly collimated X-rays from the visibility of equal-thickness fringes

Tetsuya Ishikawa · Acta Crystallographica Section A Foundations of Crystallography · 1988 · 76 citations

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Equi-lattice-spacing mapping X-ray topography

Takehiko Ishikawa, T. Kitano, Junji Matsui · Journal of Applied Crystallography · 1987 · 52 citations

, , +13

High precision goniometer system for topography and diffractometry using multiple crystal arrangement

Tetsuya Ishikawa, Junji Matsui, Tomohisa Kitano · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1986 · 45 citations

, , +9

Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray Beam

Kiyomasa Sugi, Tadashi Matsushita, K. Kohra · Journal of the Physical Society of Japan · 1971 · 28 citations

, , +13