Journal of Applied Crystallography · 1987 · 52 citations · 2 references
Natural SciencesMaterials ScienceCrystal StructureSemiconductor MaterialsCrystal LatticeCrystallographyX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionX-ray OpticsDiffraction From Crystal PlanesHigh-resolution X-ray DiffractionHigh-resolution X-ray ImagingSingle-crystal DiffractionSingle-crystal X-ray DiffractionX-ray Topography
A new X-ray topographic method is described which images with similar contrast those parts which have the same lattice spacings in an inhomogeneous single-crystal irrespective of the lattice inclination. This method was applied to GaAs, in which a variation of Δd/d ≲ 10−5 was topographically resolved.
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