Concepedia
Solid-State Electronics · 1998 · 107 citations · 22 references
Device ModelingElectrical EngineeringEngineeringBias Temperature InstabilityNumerical SimulationNoisePower ElectronicsMicroelectronicsElectromagnetic CompatibilityHigh Frequency Noise
22
An improved de-embedding technique for on-wafer high-frequency characterization
M.C.A.M. Koolen, J.A.M. Geelen, M. Versleijen · 2002 · 583 citations
Transistor Characterization, Electrical Engineering, Wafer Scale Processing +12
An efficient method for computer aided noise analysis of linear amplifier networks
H. Hillbrand, P. Russer · IEEE Transactions on Circuits and Systems · 1976 · 472 citations
Engineering, Efficient Method, Linear Circuit +12
Continuous-time MOSFET-C filters in VLSI
Y. Tsividis, M. Banu, J.M. Khoury · IEEE Journal of Solid-State Circuits · 1986 · 339 citations
Electrical Engineering, Engineering, Vlsi Architecture +12
Impact of distributed gate resistance on the performance of MOS devices
Behzad Razavi, Ran-Hong Yan, K.F. Lee · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 1994 · 224 citations
Electrical Engineering, Mos Devices, Engineering +12
An engineering model for short-channel MOS devices
K.-Y. Toh, P.K. Ko, Ralf Meyer · IEEE Journal of Solid-State Circuits · 1988 · 160 citations
Device Modeling, Electrical Engineering, Engineering +10