IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989 · 11 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesDevice ModelingDevice SimulationDielectricsSimulation MethodsVery-large-scale Integration LayoutCapacitance ModelingCircuit SimulationCompact Modeling
An inherent problem in the use of simulators for the determination of capacitance in VLSI circuits is the verification of the reliability of the simulation. The problem is due to the numerical approximations made in order to achieve a versatile simulation. The Schwarz-Christoffel transformation provides theoretically exact simulation of a limited class of problems consisting of two odd shaped conductors embedded in a uniform dielectric. It is proposed that the Schwarz-Christoffel technique can be used to calibrate simulators designed for more general problems.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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