Materials Science in Semiconductor Processing · 2014 · 25 citations · 49 references
Materials ScienceNanocrystalline MaterialIi-vi SemiconductorEngineeringApplied PhysicsSemiconductor MaterialDefect FormationDislocation DensityFaults ProbabilityHeat Treatment
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10K citations