Publication | Closed Access
Measurement of LEED intensities with a modified closed-circuit television system
11
Citations
9
References
1980
Year
EngineeringMeasurementMicroscopyElectron DiffractionElectron OpticElectromagnetic CompatibilityClosed-circuit Television SystemElectron SpectroscopyCalibrationOptical PropertiesInstrumentationElectrical EngineeringPhysicsDiffractionSynchrotron RadiationNatural SciencesSpectroscopyApplied PhysicsElectron MicroscopeTelevision RecorderInexpensive MethodLeed OpticsElectronic InstrumentationOptoelectronics
A simple and inexpensive method to record and process low-energy electron diffraction (LEED) intensities (I-V curves) is presented. A closed-circuit television system and an electronic interface allow the selection of one spot at a time. The raw data are corrected for background, beam current and transmission of the LEED optics. The intensities can be measured directly from the screen or from a television recorder.
| Year | Citations | |
|---|---|---|
Page 1
Page 1