The Journal of Physical Chemistry B · 2005 · 128 citations · 42 references
Natural SciencesChemistryMaterials ScienceMaterials CharacterizationSpectroscopic AnalysisSpectroscopyCrystal Field TheoryX-ray CrystallographyX-ray Data AnalysisX-ray SpectroscopyCrystal-field EffectsHigh-resolution X-ray SpectroscopyInelastic ScatteringResonant Inelastic X-ray ScatteringResonant ScatteringSpectral Line ShapesX-ray Absorption SpectroscopyX-ray Spectra
1s2p resonant inelastic X-ray scattering (RIXS) spectroscopy has been measured for a series of iron oxides, including octahedral and tetrahedral Fe(II) and Fe(III) systems. Their spectral shapes have been analyzed and explained using crystal-field multiplet simulations. The RIXS planes and the K-edge and L-edge X-ray absorption spectra related to these RIXS planes will be discussed with respect to their analytical opportunities. It is concluded that the full power and possibilities of 1s2p RIXS needs an overall resolution of 0.3 eV. This will yield a technique with more detailed information than K-edge and L-edge X-ray absorption combined, obtained in a single experiment. Another major advantage is that 1s2p RIXS involves only hard X-rays, and experiments under essentially any condition and on any system are feasible.
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