EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCompound SemiconductorsNoise In Electronic DevicesNoise In Semiconductor DevicesPhotodetectorsQuantum OptoelectronicsSemiconductor DetectorsAvalanche PhotodiodesInternal Quantum EfficiencyIonizationMultiplication FactorNoise In PhotodiodesPhotodiodesQuantum EfficiencySemiconductor Junctions
Low-noise germanium avalanche photodiodes of an n+-n-p structure have been investigated. Deep n+-n-p junctions have a lower noise than shallow n+-p junctions because holes have a higher ionization coefficient in germanium, and these n+-n-p diodes have a higher hole-to-electron collection efficiency. An excess noise factor F≈7 at the multiplication factor of 10 are obtained at a wavelength of 1.3 μm, whereas F≈10 for n+-p diodes. An internal quantum efficiency of 70–80% is obtained at 1.3 μm.
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Avalanche Breakdown in Germanium
S. L. Miller · Physical Review · 1955 · 373 citations
Avalanche-Photodiode Frequency Response
R. B. Emmons · Journal of Applied Physics · 1967 · 341 citations