Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 14 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsNanotechnologySemiconductor MaterialsElectron Beam PhysicsElectron DiffractionNanoelectronicsNanostructured SurfacesQuantum DotsSurface PhysicsAmorphous CarbonField EmissionFraunhofer DiffractionNanocrystalsNanofabrication Of Nanoelectronic DevicesSpatial Emission PatternsSpectral InterferencesWave Interference
Electron-beam deposited Pt emitters were exposed to radical-oxygen gas to remove the surface amorphous carbon layers of the emitters, resulting in observation of fringelike-electron-emission patterns. The superposition of electron-wave interferences due to electrons emitted from a Pt emitter was further observed. These emission patterns were found to be well reproduced by the Fraunhofer diffraction model. These results suggested that the electron-wave interference might take place by electrons emitted from emission sites of Pt nanocrystals.
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