In situ ellipsometric studies of optical and surface properties of GaAs(100) at elevated temperatures

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

Natural Sciences, Physics, Optics +13

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

D. E. Aspnes, A. A. Studna · Physical review. B, Condensed matter · 1983 · 4K citations

Natural Sciences, Materials Engineering, Materials Science +17

Ellipsometry and Polarized Light

J.P.G. Farr · Surface Technology · 1978 · 1.1K citations

Natural Sciences, Mathematics, Physics +9

Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry

D. E. Aspnes, J. B. Theeten, F. Hottier · Physical review. B, Condensed matter · 1979 · 1K citations

Natural Sciences, Materials Engineering, Materials Science +17

Interband critical points of GaAs and their temperature dependence

P. Lautenschlager, M. Garriga, S. Logothetidis et al. · Physical review. B, Condensed matter · 1987 · 848 citations

Natural Sciences, Materials Science, Condensed Matter Physics +16