Applied Physics Letters · 1981 · 125 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsRecombinationSemiconductor DevicesLaser DiodesOptical Properties Of SemiconductorsQuantum OptoelectronicsSemiconductor HeterostructuresSemiconductor LasersWide-bandgap SemiconductorsAuger RecombinationCarrier LifetimeCarrier Recombination DynamicsHeterostructure LasersNonradiative RecombinationRecombination MechanismsSpontaneous EmissionTemperature Dependence
We have calculated the nonradiative Auger recombination rate as a function of temperature in InGaAsP. Inclusion of this process can explain the observed temperature dependence of threshold and carrier lifetime of both the 1.3- and 1.55-mm InGaAsP double-heterostructure lasers. The threshold calculations are carried out using the Halperin-Lax-Kane band model, Stern’s matrix element, and Beattie-Landsberg theory of Auger recombination. Evidence of the Auger recombination is provided by a sublinearity of the spontaneous emission as a function of injection current.
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H. C. Casey, M. B. Panish, T. A. Roth · Journal of The Electrochemical Society · 1979 · 1.7K citations