Concepedia

Publication | Closed Access

Four different approaches for the measurement of IC surface temperature: application to thermal testing

DOI

47

Citations

20

References

2002

Year

Josep Altet, Stefan Dilhaire, Sebastian Volz, Jean‐Michel Rampnoux, Antonio Rubio, Stéphane Grauby, Luis David Patiño-López, Wilfrid Claeys, Jean-Bernard Saulnier
Microelectronics Journal

References

YearCitations

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