Four different approaches for the measurement of IC surface temperature: application to thermal testing

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Microscopic fluorescent imaging of surface temperature profiles with 0.01 °C resolution

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CMOS sensors for on-line thermal monitoring of VLSI circuits

V. Székely, Cs. Márta, Z. Kohari et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1997 · 102 citations

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