Josep Altet

Dynamic Surface Temperature Measurements in ICs

Josep Altet, W. Claeys, S. Dilhaire et al. · Proceedings of the IEEE · 2006 · 77 citations

Temperature Dynamics, Engineering, Measurement +21

Thermal coupling in integrated circuits: application to thermal testing

Josep Altet, Antonio Rubio, Emmanuel Schaub et al. · IEEE Journal of Solid-State Circuits · 2001 · 73 citations

Engineering, Integrated Circuits, Calibration +19

Four different approaches for the measurement of IC surface temperature: application to thermal testing

Josep Altet, Stefan Dilhaire, Sebastian Volz et al. · Microelectronics Journal · 2002 · 47 citations

Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor

Marvin Onabajo, Josep Altet, E. Aldrete-Vidrio et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2010 · 40 citations

Engineering, Dc Output, Electrothermal Design Procedure +16

Defect-oriented non-intrusive RF test using on-chip temperature sensors

Louay Abdallah, Haralampos‐G. Stratigopoulos, Salvador Mir et al. · 2013 · 32 citations

Low-power Electronics, Test Approach, Electrical Engineering +14