Concepedia

Author

Paolo Bagnoli

University of Pisa

Also Known As

BAGNOLI, PAOLO, BAGNOLI, PAOLO EMILIO, Bagnoli, P. -E., Bagnoli, Paolo, P. E. BAGNOLI, P. E. Bagnoli, P.E Bagnoli, P.E. Bagnoli, Paolo Bagnoli, Paolo Emilio Bagnoli

175

Publications

821

Citations

12

H-Index

51

Concepts

All Affiliations

University of PisaTelecom Italia LabUniversity of Pavia
PB

About

Paolo Bagnoli is an author at University of Pisa specializing in applied physics, electrical engineering, and engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

10

12

584

2

Applied Physics

10

11

573

3

Electrical Engineering

10

11

574

4

Computer Engineering

2

2

226

5

Natural Sciences

1

1

83

Paolo Bagnoli

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16

Publications

686

Citations

12

H-Index

YearCitations

Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. I. Fundamentals and theory

Paolo Bagnoli, Claudio Casarosa, Mario Ciampi,

IEEE Transactions on Power Electronics

1998

212

Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. II. Practice and experiments

Paolo Bagnoli, Claudio Casarosa, E. Dallago,

IEEE Transactions on Power Electronics

1998

109

Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections

Bruno Neri, A. Diligenti, Paolo Bagnoli

IEEE Transactions on Electron Devices

1987

83

Electromigration detection by means of low-frequency noise measurements in thin-film interconnections

A. Diligenti, Bruno Neri, Paolo Bagnoli,

IEEE Electron Device Letters

1985

48

Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method

Giuseppe Oliveti, A. Piccirillo, Paolo Bagnoli

Microelectronics Journal

1997

39

A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique

A. Diligenti, Paolo Bagnoli, Bruno Neri,

Solid-State Electronics

1989

37

A modeling methodology for thermal analysis of the PCB structure

Yabin Zhang, Paolo Bagnoli

Microelectronics Journal

2014

30

Noise measurements in thin-film interconnections: A nondestructive technique to characterize electromigration

Paolo Bagnoli, A. Diligenti, Bruno Neri,

Journal of Applied Physics

1988

21

Thermal analysis of insulated metal substrates for automotive electronic assemblies

Stefano Di Pascoli, Paolo Bagnoli, Claudio Casarosa

Microelectronics Journal

1999

19

Complete characterisation of laser diode thermal circuit by voltage transient measurements

A. Piccirillo, Giuseppe Oliveti, Maurizio Ciampa,

Electronics Letters

1993

17

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