Physical Review Letters · 1975 · 40 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsSurface ScienceElectron Spin Resonance SpectroscopySilicon MaterialsSurface CharacterizationSurface MagnetismSurface PhysicsSurface SpectroscopyAmorphous SiliconAmorphous Thin FilmsHigh-frequency Electron Spin ResonanceSiliconSilicon PhysicsSilicon Surface ScienceSpin Density DistributionVacuum Conditions
In situ electron-spin-resonance measurements have been performed on silicon crystals cleaved under ultrahigh-vacuum conditions. Our observations are in conflict with existing publications which report a surface signal ($g=2.0055$) corresponding to a spin density of the order of ${10}^{14}$/${\mathrm{cm}}^{2}$. No signal which could be ascribed to the cleaved surface was detected although the minimum detectable surface spin density was less than ${10}^{13}$/${\mathrm{cm}}^{2}$. In view of this result we comment on the origin of the ESR observed in powders and amorphous films.
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