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Stranski-Krastanov formation of InAs quantum dots monitored during growth by reflectance anisotropy spectroscopy and spectroscopic ellipsometry

EngineeringReflectance Anisotropy SpectroscopyOptical PropertiesSpectroscopySurface ScienceApplied PhysicsNanotechnologyStranski-krastanov FormationNatural SciencesCrystal Growth TechnologyChemistryInas Quantum DotsOptical SpectroscopySpectroscopic PropertySemiconductor Nanostructures