XPS and raman investigations of nitrogen ion etching for depth profiling of CuInSe 2 and CuGaSe 2 - Concepedia

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XPS and raman investigations of nitrogen ion etching for depth profiling of CuInSe 2 and CuGaSe 2

23

Citations

14

References

2000

Year

K. Otte, G. Lippold, D. Hirsch, A. Schindler, F. Bigl

Thin Solid Films

Materials ScienceSurface CharacterizationNitrogen IonEngineeringNatural SciencesSpectroscopySurface ScienceApplied PhysicsSurface AnalysisChemistryRaman InvestigationsPlasma EtchingCuinse 2

References

	Year	Citations

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