A. Schindler - Concepedia

Author

A. Schindler

Leibniz Institute of Surface Engineering

Also Known As

A Schindler, A. Schindler

Publications

1.6K

Citations

H-Index

Concepts

All Affiliations

Leibniz Institute of Surface Engineering Leipzig University Leibniz Institute for Neurobiology Saarland University Yale University

About

A. Schindler is an author at Leibniz Institute of Surface Engineering specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	28	1.4K
2	Applied Physics	20	26	1.1K
3	Natural Sciences	6	6	144
4	Education	2	2	56
5	Medicine	1	1	320

A. Schindler

Publications

1.5K

Citations

H-Index

Page 1

	Year	Citations
Roughness Evolution of Ion Sputtered Rotating InP Surfaces: Pattern Formation and Scaling Laws Frank Frost, A. Schindler, F. Bigl Physical Review Letters EngineeringMicroscopyTopography EvolutionRoughness EvolutionIon Beam	2000	320
Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook Thomas Arnold, G. Böhm, Renate Fechner, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Materials ScienceEngineeringUltra-precision Surface FinishingMicrofabricationSurface Science	2009	206
Surface engineering with ion beams: from self-organized nanostructures to ultra-smooth surfaces Frank Frost, B. Ziberi, A. Schindler, Applied Physics A Materials ScienceEngineeringNanotechnologySelf-assemblySurface Science	2008	166
Interstitial nitrogen induced by low-energy ion beam nitridation of AIII–BV semiconductor surfaces J.-D. Hecht, Frank Frost, D. Hirsch, Journal of Applied Physics Materials ScienceRoom TemperatureElectrical EngineeringIon ImplantationAiii–bv Semiconductor Surfaces	2001	66
Chemical bath deposition of CdS buffer layer: prospects of increasing materials yield and reducing waste Dimitrios Hariskos, Michael Powalla, N Chevaldonnet, Thin Solid Films Materials ScienceMaterials EngineeringChemical EngineeringIi-vi SemiconductorCds Buffer Layer	2001	55
Fundamentals for magnetic patterning by ion bombardment of exchange bias layer systems Arno Ehresmann, Dieter Engel, T. Weis, physica status solidi (b) EngineeringMagnetic ResonanceMagnetic MaterialsIon ProcessMagnetism	2006	42
In situ characterization of the nitridation of AIII–BV semiconductor surfaces by means of X-ray photoelectron spectroscopy J.-D. Hecht, Frank Frost, Thomas Chassé, Applied Surface Science Materials ScienceSurface CharacterizationAiii–bv Semiconductor SurfacesEngineeringSurface Analysis	2001	41
Ion beam smoothing of indium-containing III-V compound semiconductors Frank Frost, A. Schindler, F. Bigl Applied Physics A SemiconductorsElectrical EngineeringIon ImplantationEngineeringIon Beam Smoothing	1998	41
Investigations on the spatial resolution of autocollimator-based slope measuring profilers Frank Siewert, Jana Buchheim, Tobias Höft, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Sensor CalibrationEngineeringMeasurementCalibrationCivil Engineering	2012	34
Measurement of the average lifetime of<i>B</i>hadrons produced in<i>pp¯</i>collisions at √<i>s</i>=1.8 TeV F. Abe, M. Albrow, D. Amidei, Physical Review Letters	1993	34

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