Test generator with preselected toggling for low power built-in self-test

Abstract

This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.