In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

Natural Sciences, Materials Engineering, Materials Science +16

A model for the successful growth of polycrystalline films of CuInSe₂ by multisource physical vacuum evaporation

R. Klenk, Thomas Walter, Hans‐Werner Schock et al. · Advanced Materials · 1993 · 261 citations

Natural Sciences, Materials Engineering, Materials Science +17

Solar cells based on CuInS2—an overview

R. Klenk, J. Klaer, Roland Scheer et al. · Thin Solid Films · 2005 · 221 citations

Engineering, Materials Engineering, Materials Science +12

The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

Ch. Genzel, Ingwer A. Denks, Jens Gibmeier et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2007 · 207 citations

Natural Sciences, Materials Engineering, Materials Science +12

Improved performance of thin film solar cells based on Cu(In,Ga)S2

R. Kaigawa, A. Neisser, R. Klenk et al. · Thin Solid Films · 2002 · 101 citations

Natural Sciences, Materials Engineering, Materials Science +12