Concepedia

Precise determination of the refractive index of sputtered MgO thin films in the visible light range

Shigeru Baba, Isao Mori, Takeo Nakano

Vacuum · 2000 · 24 citations · 4 references

DOI

Concepts

References

4

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

, , +17

Physics of Thin Films

G. Hass, D. Gerstenberg · Journal of The Electrochemical Society · 1964 · 1.8K citations

, , +12

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

R. Swanepoel · Journal of Physics E Scientific Instruments · 1984 · 721 citations

, , +17

Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster Angle

S. P. F. Humphreys-Owen · Proceedings of the Physical Society · 1961 · 155 citations

, , +15