Concepedia

An empirical model for early resistance changes due to electromigration

J. Niehof, H.C. de Graaff, A.J. Mouthaan, J. F. Verwey

Solid-State Electronics · 1995 · 14 citations · 12 references

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Concepts

References

12

A model for conductor failure considering diffusion concurrently with electromigration resulting in a current exponent of 2

M. Shatzkes, J. R. Lloyd · Journal of Applied Physics · 1986 · 302 citations

, , +17

Grain size dependence of electromigration-induced failures in narrow interconnects

J. Cho, Carl V. Thompson · Applied Physics Letters · 1989 · 206 citations

, , +17

Stress and electromigration in Al-lines of integrated circuits

R. Kirchheim · Acta Metallurgica et Materialia · 1992 · 205 citations

, , +12

Atomistic and computer modeling of metallization failure of integrated circuits by electromigration

R. Kirchheim, U. Kaeber · Journal of Applied Physics · 1991 · 123 citations

, , +17

Statistical Metallurgical Model for Electromigration Failure in Aluminum Thin-Film Conductors

M. J. Attardo, Richard E. Rutledge, Raymond Jack · Journal of Applied Physics · 1971 · 122 citations

, , +17