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Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements

EngineeringPhysicsMicroscopyMechanicsSpectroscopyPhase ShiftApplied PhysicsNatural SciencesMicroscopy MethodForce-probe MeasurementsScanning Probe MicroscopyScanning Force MicroscopyLight MicroscopyEnergy DissipationNanomechanics