Physical limitations of MOS structures

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

Lewis M. Terman · Solid-State Electronics · 1962 · 1.4K citations

Engineering, Materials Engineering, Materials Science +14

Physical Theory of Semiconductor Surfaces

C. G. B. Garrett, W. H. Brattain · Physical Review · 1955 · 558 citations

Natural Sciences, Materials Science, Physics +17

Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures

Andrew S. Grove, B. E. Deal, E. H. Snow et al. · Solid-State Electronics · 1965 · 416 citations

Engineering, Materials Engineering, Materials Science +14

Effective Carrier Mobility in Surface-Space Charge Layers

J. R. Schrieffer · Physical Review · 1955 · 383 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Calculation of the Space Charge, Electric Field, and Free Carrier Concentration at the Surface of a Semiconductor

Robert H. Kingston, S. F. Neustadter · Journal of Applied Physics · 1955 · 371 citations

Engineering, Electrical Engineering, Materials Science +17