Concepedia
Materials Chemistry and Physics · 1994 · 14 citations · 32 references
32
Range and stopping-power tables for heavy ions
L. C. Northcliffe, Roland Schilling · Atomic Data and Nuclear Data Tables · 1970 · 2.7K citations
Natural Sciences, Nuclear Engineering, Physics +13
Alpha-particle-induced soft errors in dynamic memories
T.C. May, M. H. Woods · IEEE Transactions on Electron Devices · 1979 · 853 citations
Natural Sciences, Computer Engineering, Physics +17
The sputtering process and sputtered ion emission
Peter Williams · Surface Science · 1979 · 332 citations
Natural Sciences, Materials Engineering, Materials Science +8
A new secondary ion mass spectrometry technique for III-V semiconductor compounds using the molecular ions CsM+
Yijie Gao · Journal of Applied Physics · 1988 · 282 citations
Natural Sciences, Chemistry, Materials Science +16
Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling
A. Zalar · Thin Solid Films · 1985 · 249 citations
Natural Sciences, Materials Science, Analytical Chemistry +7