Publication | Closed Access
Identification of getter defects in high-energy self-implanted silicon at Rp/2
21
Citations
3
References
2001
Year
Defect ToleranceElectrical EngineeringGetter DefectsEngineeringPhysicsNanoelectronicsApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsSilicon Debugging
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