Nanoscale Research Letters · 2013 · 14 citations · 19 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLight SourcesLight-emitting DiodesOptoelectronic DevicesOptoelectronic MaterialsSemiconductor Device MaterialsSemiconductor HeterostructuresBlue Light EmissionCurrent-voltage CharacterizationCurrent-voltage RelationsElectroluminescenceGallium Nitride Light-emitting DiodesHeterostructured MaterialsMolecular Beam EpitaxyReverse Bias Characteristics
ZnO/InGaN/GaN heterostructured light-emitting diodes (LEDs) were fabricated by molecular beam epitaxy and atomic layer deposition. InGaN films consisted of an Mg-doped InGaN layer, an undoped InGaN layer, and a Si-doped InGaN layer. Current-voltage characteristic of the heterojunction indicated a diode-like rectification behavior. The electroluminescence spectra under forward biases presented a blue emission accompanied by a broad peak centered at 600 nm. With appropriate emission intensity ratio, the heterostructured LEDs had potential application in white LEDs. Moreover, a UV emission and an emission peak centered at 560 nm were observed under reverse bias.
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Ultralow‐Threshold Laser Realized in Zinc Oxide
Hai Zhu, Chongxin Shan, Bin Yao et al. · Advanced Materials · 2009 · 215 citations