Applied Physics Letters · 2009 · 26 citations · 18 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsOptoelectronicsSemiconductor DevicesHigh-frequency Semiconductor DevicesIntegrated Circuit DevicesIntegrated PhotonicsPhotodetectorsPhotonic Integrated CircuitsSilicon PhotonicsDevice FabricationGermanium PhotodetectorsIntegrated PhotodetectorsMillimeter-wave Integrated CircuitsReverse Bias CharacteristicsSilicon PhotodetectorsSilicon PhotodiodesSilicon Photonics Integration
This paper reports on surface illuminated Ge photodetectors monolithically integrated on Si substrate operating in the C and L wavelength bands. The responsivity at a wavelength of 1.5 μm ranges from 0.08 to 0.21 A/W without bias voltage for Ge mesa diameter ranging from 10 to 25 μm, respectively. The measured −3 dB cut-off frequency is as high as 49 GHz under a reverse bias of 5 V at a wavelength of 1.5 μm. An open eye diagram up to 40 Gbit/s is also demonstrated.
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31 GHz Ge n-i-p waveguide photodetectors on Silicon-on-Insulator substrate
Tao Yin, Rami Cohen, Mike Morse et al. · Optics Express · 2007 · 395 citations · Full text