High-radiation-resistant InGaP, InGaAsP, and InGaAs solar cells for multijuction solar cells

Abstract

The radiation response of 3 MeV proton-irradiated InGaP, InGaAsP and InGaAs solar cells was measured and analyzed in comparison with those of InP and GaAs. The degradation of the minority-carrier diffusion length was estimated from the spectral response data. The damage coefficient KL for the 3 MeV proton-irradiated InGaP, InGaAsP and InGaAs was also determined. The radiation resistance increases with an increase in the fraction of In–P bonds in InGaP, InGaAsP and InGaAs. Differences in the radiation resistance of InGaP, InGaAs and InGaAs materials are discussed. Minority-carrier injection under forward bias is found to cause partial recovery of the degradation on irradiated InGaP and InGaAsP cells.