Journal of Physics Conference Series · 2009 · 11 citations · 8 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryNanotechnologySpectroscopyScanning Probe MicroscopyX-ray DetectionX-ray DetectorsX-ray OpticsX-ray Photoelectron SpectroscopyX-ray SpectroscopyDetector SimulationFresnel Zone PlatesHigh-resolution MappingHigh-resolution X-ray ImagingHigh-resolution X-ray SpectroscopyMicroscope ImagingX-ray Absorption Spectroscopy
We currently develop a novel type of scanning x-ray microscope. This instrument will combine the chemical specificity of x-ray absorption spectroscopy with the very high spatial resolution of scanning probe microscopy . In a fundamentally new instrumental approach, the instrument can be used as a conventional scanning transmission x-ray microscope (STXM), as a conventional scanning probe microscope (SPM) or in a mode combining these two techniques. In the latter case, the sample is placed in the focus generated by the fresnel zone plate of the STXM. The SPM-tip placed downstream acts as as a local detector of the emitted photoelectrons. Simulations and experiments have shown that the use of shielded SPM-tips is crucial to obtain a strongly increased chemical resolution. In contrast to similar projects underway at other synchrotrons we use a coaxial geometry. This should greatly enhance the flux density and reduce background signals caused by straylight illuminating the tip.
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Akira Saito, Junpei Maruyama, Ken Manabe et al. · Journal of Synchrotron Radiation · 2006 · 47 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +14
X-ray-excited photoelectron detection using a scanning tunneling microscope
Volker Rose, J. W. Freeland, K. E. Gray et al. · Applied Physics Letters · 2008 · 31 citations