Behavior of Nanomagnet Logic in the presence of thermal noise

Abstract

We use numerical simulations to analyze the behavior of Nanomagnet Logic (NML) in the presence of room-temperature thermal fluctuations and discuss simple models to estimate temperature-induced error rates in these devices. Our calculations show that small NML gates - composed of sub-100 nm size dots - are sufficiently stable against temperature fluctuations, but thermal noise imposes design constraints for structures with long signal paths.