Microelectronics Reliability · 2015 · 29 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsPhysical DesignVery-large-scale Integration LayoutWide-bandgap Semiconductor DevicesDevice Scaling EffectsDiamond Semiconductor DevicesDiamond SemiconductorsHigh-temperature Device OperationHigh-temperature ElectronicsThermal-aware LayoutThermal-aware Physical Design
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Fernando Silveira, Denis Flandre, P.G.A. Jespers · IEEE Journal of Solid-State Circuits · 1996 · 650 citations