Characterization of Si/SiO2 interface defects by electron spin resonance - Concepedia

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Characterization of Si/SiO2 interface defects by electron spin resonance

234

Citations

55

References

1983

Year

Edward H. Poindexter, P. J. Caplan

Progress in Surface Science

SpintronicsEngineeringSi/sio2 Interface DefectsApplied PhysicsSiliceneDefect FormationSilicon On Insulator

References

	Year	Citations

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