Publication | Closed Access
Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials
182
Citations
56
References
2011
Year
Materials ScienceEngineeringMicroscopyOptical PropertiesSpectroscopyScanning Probe MicroscopyApplied PhysicsThin-film MaterialsNeutron SourceMicroanalysisNanometrologyThin FilmsNeutron Scattering
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