CVD-based tungsten carbide schottky contacts to 6H-SiC for very high-temperature operation

Physics of Semiconductor Devices

Geoffrey Pridham · Electronics and Power · 1970 · 4K citations

Engineering, Electrical Engineering, Physics +12

Metal-semiconductor contacts

E. H. Rhoderick · IEE Proceedings I Solid State and Electron Devices · 1982 · 1.7K citations

Engineering, Electrical Engineering, Materials Science +17

Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System

Alvin M. Goodman · Journal of Applied Physics · 1963 · 449 citations

Engineering, Electrical Engineering, Materials Science +17

Thin film deposition and microelectronic and optoelectronic device fabrication and characterization in monocrystalline alpha and beta silicon carbide

R. F. Davis, G. Kelner, M. S. Shur et al. · Proceedings of the IEEE · 1991 · 407 citations

Engineering, Electrical Engineering, Materials Science +17

Progress in silicon carbide semiconductor electronics technology

Philip G. Neudeck · Journal of Electronic Materials · 1995 · 271 citations

Engineering, Electrical Engineering, Materials Science +12